Milan Terek
Estimating Some Metrics in Six Sigma Through Confidence Intervals
Číslo: 1/2024
Periodikum: Quality Innovation Prosperity
DOI: 10.12776/qip.v28i1.1972
Klíčová slova: confidence interval; defects per unit; free of defects unit; rolled throughput yield
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Methodology/Approach: This approach assumes that the process follows a normal distribution with a constant variance. The mean of the process is shifted from the target value to the right or left by 1.5 standard deviations. The estimates are based on a random sample of size n taken during a time when the process is stable.
Findings: The paper describes how to create confidence intervals for the number of defects per unit, the probability that a unit will be free of defects, and the rolled throughput yield.
Research Limitation/implication: We assume a discrete process in which n units of the product are selected during a time when the process is stable.
Originality/Value of paper: By applying the proposed estimation procedures, process performance evaluations can be improved, facilitating decision-making for Six Sigma projects.