Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Dinara Sobola, Stefan Talu, Petr Sadovsky, Nikola Papez, Lubomir Grmela

Application of AFM Measurement and Fractal Analysis to Study the Surface of Natural Optical Structures

Číslo: 3/2017
Periodikum: Advances in Electrical and Electronic Engineering
DOI: 10.15598/aeee.v15i3.2242

Klíčová slova: Atomic force microscopy; diffraction grating; fractal analysis; structural coloration; wing surface, Mikroskopie atomové síly; difrakční mřížka; fraktální analýza; strukturální zbarvení; povrch křídla.

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Anotace: The wings scales of the butterflies were studied by Atomic Force Microscopy (AFM) in the air. Measurements were done without special preparation of species in order to observe the surface in real conditions. The data of probe microscopy (figures) confirm AFM to be a powerful technique for determining features of the insects' wings. These features play a key role in optical phenomena which makes fascinating wings coloration. The structure determines light reflection, propagation, and diffraction. AFM imaging was done at the areas of specific colors without scale separation.