T. Napravnik, J. Jakovenko

An Automated ESD Model Characterization Method

Číslo: 3/2018
Periodikum: Radioengineering Journal
ISBN: 1210-2512
DOI: 10.13164/re.2018.0784

Klíčová slova: ESD, automated model calibration, differential evolution, Nelder-Mead simplex, I-V characteristic, ESD, automatizovaná kalibrace modelu, diferenciální vývoj, Nelder-Mead simplex, I-V charakteristika

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Anotace: Novel automated simulator-independent ESD model characterization method based on Differential evolution and Nelder-Mead Simplex algorithms is presented in this paper. It offers an alternative for time and human-resources demanding manual characterization that is still widely used. The paper also presents stable models of the four most often used snapback-based protection devices in CMOS technologies, i.e., NMOST and three variants of silicon-controlled rectifier structure. These models were used for evaluation of the proposed method and the results are included and discussed.